Linewidth Measurement of a Narrow-Linewidth Laser: Principles, Methods, and Systems

Linewidth Measurement of a Narrow-Linewidth Laser: Principles, Methods, and Systems

Blog Article

Narrow-linewidth lasers mainly depend on the development of advanced laser linewidth measurement methods for related technological progress as key devices in satellite laser communications, precision measurements, ultra-high-speed optical communications, and other fields.This manuscript provides a theoretical analysis of linewidth characterization Soft Top Hardware methods based on the beat frequency power spectrum and laser phase noise calculations, and elaborates on existing research of measurement technologies.In addition, to address the technical challenges of complex measurement systems that 75 Ohm RG59 commonly rely on long optical fibers and significant phase noise jitter in the existing research, a short-delay self-heterodyne method based on coherent envelope spectrum demodulation was discussed in depth to reduce the phase jitter caused by 1/f noise.We assessed the performance parameters and testing conditions of different lasers, as well as the corresponding linewidth characterization methods, and analyzed the measurement accuracy and error sources of various methods.